International Journal of All Research Education & Scientific Methods

An ISO Certified Peer-Reviewed Journal

ISSN: 2455-6211

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Structural Analysis on Growth and Characteriz...

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Structural Analysis on Growth and Characteriz...

Structural Analysis on Growth and Characterization of Mgϰ Zn(1-x) SO4 .7H2O Single Crystals

Author Name : V. Mahalingam

ABSTRACT

X-Ray diffraction analysis (XRD) is a non-destructive technique that provides detailed information about the crystallographic structure, chemical composition, and physical properties of a material. It is based on the constructive interference of monochromatic X-rays and a crystalline sample. X-rays are shorter wavelength electromagnetic radiation that is generated when electrically charged particles with sufficient energy are decelerated MgSO4.7H2O and ZnSO4.7H2O are considered as metal sulphate single crystals. It was grown by slow evaporation method of pure and mixed Mgϰ Zn(1-x) SO4 .7H2O with aqueous solution. The grown crystals were characterized structurally by using XRD and confirm that the crystals belong to orthorhombic system with space group p2, p2, p21. The variation in lattice volume of the mixed crystals confirms the formation of binary system.

Keywords: X-ray diffraction